摘要： Soft-error induced reliability problems have become a major challenge in designing new generation microprocessors. Three researchers will talk about soft errors for 40 and 28 nm technologies, radiation- and fault-tolerant microelectronics and cross layer reliability towards self healing.
主持人：李华伟研究员，中科院计算所
报告时间：2011年11月15日（周二）上午 9:30-12:00
报告地点：计算所 446室
报告一: Soft errors in 40 and 28 nm 报告人: Prof. Bharat Bhuva from Vanderbilt University (美国范德比特大学)
报告二: Radiation- and fault-tolerant microelectronics 报告人: Prof. Li Chen from University of Saskatchewan(加拿大萨斯卡彻温大学
报告三: Cross layer reliability towards self healing 报告人: Dr. Shi-Jie Wen from Cisco Systems Inc. USA
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