美国学者Prof. Jacob Abraham (UT/Austin)访问实验室

2011年4月11-24日, 美国学者Prof. Jacob Abraham (University of Texas, Austin)访问实验室.

4月14日(周四)上午9点, 748会议室. Prof. Jacob A. Abraham做了题为"Design for Specification-Based Test"的学术报告.

摘要：One approach to manage the complexity of testing large digital circuits has been to generate the tests based on the structure of the circuit, based on the gate-level "stuck-at" fault model.  In contrast, analog circuits are tested for adherence to their specifications.  This talk will contrast the two approaches and discuss how digital circuits may require specification-based tests.  Design-for-test (DfT) techniques for digital and analog circuits to facilitate specification-based tests will be described.  Simulation and hardware measurement results which demonstrate the necessity and benefits of the DfT techniques will also be presented.
 
主讲人介绍：Jacob A. Abraham is Professor of Electrical and Computer Engineering and Professor of Computer Sciences at the University of Texas at Austin.  He is also the director of the Computer Engineering Research Center and holds a Cockrell Family Regents Chair in Engineering.  He received his Ph.D. in Electrical Engineering and Computer Science from Stanford University in 1974. His research interests include VLSI design and test, formal verification, and fault-tolerant computing.  He has published extensively and has been included in a list of the most cited researchers in the world.  He has supervised more than 80 Ph.D. dissertations, and is particularly proud of the accomplishments of his students, many of whom occupy senior positions in academia and industry.  He has been elected Fellow of the IEEE as well as Fellow of the ACM, and is the recipient of the 2005 IEEE Emanuel R. Piore Award.