Some Chinese Words in My Related Work

English Chinese English Chinese
Many-Cores 众核 Test Wrapper 测试外壳
Network-On-Chip(NOC) 片上网络 Compaction 压缩(有损)
3D Chip 三维芯片 X bits 无关位
Test Compression 测试压缩 Small Delay Defect 小时延缺陷
Optical Interconnect 光互连 Timing Variation 时序偏差
Process Variation 工艺偏差 Trough Silicon Vias 硅直通孔
Negative bias temperature instability 副偏压温度不稳定性 Voltage Emergency 电压激变

Computer Engineering Academic Genealogy (From Yuan Xie, PSU)

More Information

 
Related Conferences

    International Symposium on Computer Architecture(ISCA)(2006)
International Solid-State Circuits Conference (ISSCC)
Design Automation Conference(DAC)
International Test Conferenc(ITC)
International Conference on Dependable Systems and Networks (DSN)
VLSI Test Symposium(VTS)
International Confernce on Computer Aided Design (ICCAD)
Design Automation and Test in Europe(DATE)
International Conference Computer Design (ICCD)
International Symposium on Quality Electronic Design(ISQED)
Asia and South Pacific Design Automation Conference(ASPDAC)
Asian Test Symposium(ATS) (2005, 2004, 2003)
Workshop on RTL and High Level Testing(WRTLT) (2005, 2004, 2003)
Euopean Test Symposium(ETS)
International Conference on VLSI Design(ICVLSI) (2005, 2004)
     
Related Journals on VLSI Design and Test

    See the details...
     
Test Research in China

    Prof. Shiyi Xu, Shanghai University ( 徐拾义 , 上海大学 ) . [in Chinese]
Prof. Zhongcheng Li, Institute of Computing Technolog ( 李忠诚研究员,中科院计算所 ) .
Prof. Yihe Sun, Tsinghua University(孙义和教授,清华大学). [in Chinese]
     
Related Scholars

    Dr. Vishwani D. Agrawal, Agere Systems
Prof. Prithviraj Banerjee, Northwestern University
Prof. Douglas M. Blough, University of California, Irvine
Prof. Melvin Breuer, University of Southern California
Prof. Kwang-Ting (Tim) Cheng, University of California, Santa Barbara
Prof. Sujit Dey, University of California, San Diego
Prof. Andre Ivanov , University of British Columbia
Prof. Bruce C. Kim , Arizona State University
Prof. Christian Landrault , LIRMM
Prof. Samiha Mourad, Santa Clara University
Prof. Alex Orailoglu, University of California, San Diego
Prof. Janak H. Patel, University of Illinois
Dr. David Powell, LAAS-CNRS
Prof. Irith Pomeranz , University of Iowa
Prof. Paolo Prinetto, Politecnico di Torino
Prof. Kewal K. Saluja, University of Wisconsin - Madison
Prof. Jacob Savir , New Jersey Institute of Technology
Prof. Krishnendu Chakrabarty, Duke University
Prof. Hideo Fujiwara, Nara Institute of Science and Technology (Asian)
     
Test Related Groups Sites

    Illinois Test Research Home Page
Fujiwara Lab Home Page (Asian)

Laboratory for Reliable Computing, National Tsinghua University.
     
Test Related Organization
    Test Technology Technical Council(TTTC)
National Natural Science Foundation of China
Hi-Tech Research and Development Program of China(863)
National Basic Research Program of China(973)
     
Benchmark, Standard and Tools

    ITC'02 SOC Test Benchmarks
ITC'99 Benchmark Homepage
CAD Benchmarking Laboratory (CBL) at North Carolina State University
High Level Synthesis Resources at UCSB
Advanced EDA Benchmark Datasets
OPENCORES.ORG
IEEE Standards
IEEE P1500, Standards for Embedded Core Test
Links to CAD: Free/Shareware Software
Links to CAD: Commercial Software
ITEC/PROOFS: A Sequential Circuit Test Generation and Fault Simulation Package
CAD Software at University of California, Berkeley
CAD Software at Stanford University
anWorks (ATPG for Macintosh)
վģ